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Subject : "Electron"
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Electron microscopy
Author(s) : Sjostrand, F. S. - Rhodin, J. -
Edition :
Call Number : 578.15 ELE
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Scanning electron microscopy
Author(s) : Wells, Oliver C. -
Edition :
Call Number : 502.8 WEL
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Applied electron microscopy
Author(s) : Fischer, Robert B. -
Edition :
Call Number : 502.825 FIS
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Practical scanning electron microscopy
Author(s) : Goldstein, Joseph I. - Yakowitz, Harvey -
Edition :
Call Number : 578 GOP
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Scanning electron microscopy and x-ray microanalysis
Author(s) : Goldstein, Joseph I. -
Edition :
Call Number : 520.825 SCA
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Electron microscopy of materials
Author(s) : Heimendahl, Manfred Von - Wolff, Ursula E. -
Edition :
Call Number : 530.11 HEI
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Scanning electron microscopy
Author(s) : Thornton, P. R. -
Edition :
Call Number : 578.15 THO
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Recombination lifetime measurements in silicon
Author(s) : Gupta, Dinesh C. - Bacher, Fred R. - Hughes, William M. -
Edition :
Call Number : 621.38152 REC
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Techniques for electron microscopy
Author(s) : Kay, Desmond -
Edition : 2nd ed.
Call Number : 578.15 TEC/1965
Record Detail
Picosecond electronics and optoelectronics
Author(s) : Sollner, T. C. L. Gerhard - Bloom, David M. -
Edition :
Call Number : 535 OSA/1989
Record Detail
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