Recombination lifetime measurements in silicon

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Title	Recombination lifetime measurements in silicon
Edition
Call Number	621.38152 REC
ISBN/ISSN	0-8031-2489-9
Author(s)	Gupta, Dinesh C. - Personal Name Bacher, Fred R. - Personal Name Hughes, William M. - Personal Name
Subject(s)	Semiconductors - Testing - Congresses Service Life \'Engineering\' - Forecasting - Congr Electronic Measurements - Congresses
Classification	621.38152
Series Title
GMD	Text
Language	English
Publisher	American Society for Testing and Materials
Publishing Year	1998
Publishing Place	West Conshohocken
Collation	392p
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