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Title | Recombination lifetime measurements in silicon |
Edition | |
Call Number | 621.38152 REC |
ISBN/ISSN | 0-8031-2489-9 |
Author(s) | Gupta, Dinesh C. - Personal Name Bacher, Fred R. - Personal Name Hughes, William M. - Personal Name |
Subject(s) | Semiconductors - Testing - Congresses Service Life \'Engineering\' - Forecasting - Congr Electronic Measurements - Congresses |
Classification | 621.38152 |
Series Title | GMD | Text |
Language | English |
Publisher | American Society for Testing and Materials |
Publishing Year | 1998 |
Publishing Place | West Conshohocken |
Collation | 392p |
Abstract/Notes | |
Specific Detail Info | |
Image | |
File Attachment | LOADING LIST... |
Availability | LOADING LIST... |
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