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Found 2 from your keywords:
Subject : "Integrated circuits - Testing"
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Principles of semiconductor network testing
Author(s) : Afshar, Amir -
Edition :
Call Number : 621.381548 AFS
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Fault diagnosis of digital circuits
Author(s) : Yarmolik, V.N. -
Edition :
Call Number : 621.3815 YAR
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