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Found 3 from your keywords:
Subject : "Semiconductors - Testing"
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Recombination lifetime measurements in silicon
Author(s) : Gupta, Dinesh C. - Bacher, Fred R. - Hughes, William M. -
Edition :
Call Number : 621.38152 REC
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Principles of semiconductor network testing
Author(s) : Afshar, Amir -
Edition :
Call Number : 621.381548 AFS
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Semiconductor material and device characterization
Author(s) : Schroder, Dieter K. -
Edition : 2nd ed.
Call Number : 621.38152 SCH
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